• DocumentCode
    61643
  • Title

    Metrics for the Measurement of the Quality of Stimuli in Radiation Testing Using Fast Hardware Emulation

  • Author

    Mogollon, J.M. ; Guzman-Miranda, H. ; Napoles, J. ; Aguirre, M.A.

  • Author_Institution
    Sch. of Eng., Univ. de Sevilla, Sevilla, Spain
  • Volume
    60
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2456
  • Lastpage
    2460
  • Abstract
    Radiation Testing of unstructured digital circuits presents an extended set of difficulties related with detection and propagation of the faults to the primary outputs. Stimuli have to be chosen thinking on the possibility of propagating the faults through the logic to the primary outputs. Moreover, the set of stimuli should be selected to enhance the observability of both the time and location of the internal faults.
  • Keywords
    digital circuits; fault diagnosis; integrated circuit measurement; integrated circuit testing; radiation effects; hardware emulation; internal faults; primary outputs; radiation testing; stimuli set; unstructured digital circuits; Circuit faults; Dictionaries; Emulation; Hardware; Measurement; Testing; Vectors; Fault masking; hash codes; radiation testing; single event effects; test fixture;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2241079
  • Filename
    6464617