ADC spectral testing allowing amplitude clipping

Author

Li Xu ; Degang Chen

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

fYear

2013

fDate

6-9 May 2013

Firstpage

1526

Lastpage

1529

Abstract

In Built-In Self-Test, it is hard to control the amplitude of the input sine wave approximately equal but slightly less than the full scale of the ADC under test, under which condition correct spectral performance can be obtained. This paper proposes a new algorithm which can achieve accurate testing result when the input sine wave is larger than the full scale of the ADC. It also relaxes an IEEE standard requirement on the amplitude of the input sine wave. Simulation results of 4 different resolution ADCs show accurate spectral performance on THD, SFDR, ENOB and SNR. Measurement result of a 16-bit ADC validated the algorithm.

Keywords

IEEE standards; analogue-digital conversion; built-in self test; ADC spectral testing; ENOB; IEEE standard requirement; SFDR; SNR; THD; amplitude clipping; amplitude control; built-in self-test; input sine wave; spectral performance; word length 16 bit; Built-in self-test; Frequency measurement; Harmonic analysis; IEEE standards; Signal to noise ratio; BIST; IEEE standard; amplitude clipping; spectral testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International

Conference_Location

Minneapolis, MN

ISSN

1091-5281

Print_ISBN

978-1-4673-4621-4

Type

conf

DOI

10.1109/I2MTC.2013.6555669

Filename

6555669