• DocumentCode
    618491
  • Title

    Custom tools for IC LD evaluation

  • Author

    Chari, K.S. ; Sharma, Mukesh

  • Author_Institution
    Integrated Circuits Layout Design Registry, Gov. of India, New Delhi, India
  • fYear
    2013
  • fDate
    11-12 April 2013
  • Firstpage
    1299
  • Lastpage
    1304
  • Abstract
    Integrated Circuits (ICs) have become backbone driving all electronic products in market; and with the advances of technologies in different domains have become highly complex. Lead by shrinking size, the number of the geometries in the IC Layout Designs (IC LDs) has exponentially increased and are approaching the gigs scale. In a fierily competitive market place of present times, to protect the Intellectual Property Rights (IPR) on the IC Layouts generated at huge manpower and time efforts has become an important factor for survival. For the protection of IC LDs , the first steps is to be able to find from the prior-art analysis, whether any infringement is likely between the chip under design and any existing designs in the area. Both for the creator of the design and the chip IP granting authority , it is important to assess the non-commonness and distinctiveness of IC LD. Traditional VLSI ECAD tools are unable to offer robust confirmative assessment in this domain as discussed by the authors in previous work[1]. In this paper, customized ECAD suites of tools from Softjin are analyzed for comparing the two IC LDs for their uniqueness and possible similarities. Results of the example runs with the ICLDDTv2 tool are presented.
  • Keywords
    VLSI; circuit layout CAD; industrial property; integrated circuit layout; market opportunities; IC LD evaluation; IC layout designs; VLSI ECAD tools; custom tools; electronic products; integrated circuits; intellectual property rights; market; Communications technology; Conferences; Geometry; Integrated circuit layout; Layout; Shape; ICLD; ICLDDT; IPR Integrated Circuit Layout Design; NxComapre; check; geometry equivalence; layout and geometry comparison;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information & Communication Technologies (ICT), 2013 IEEE Conference on
  • Conference_Location
    JeJu Island
  • Print_ISBN
    978-1-4673-5759-3
  • Type

    conf

  • DOI
    10.1109/CICT.2013.6558302
  • Filename
    6558302