Title :
Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
Author :
Lucibello, Andrea ; Marcelli, Romolo ; Proietti, E. ; Bartolucci, G. ; Mulloni, V. ; Margesin, Benno
Author_Institution :
IMM Roma, Rome, Italy
Abstract :
In this paper RF MEMS switches in coplanar waveguide (CPW) configuration designed for redundancy space applications have been analyzed, to demonstrate their reliability in terms of microwave performances when subjected to DC actuations up to one million cycles. As a result, both the investigated structures fulfill the current electrical requirements expected for redundancy logic purposes.
Keywords :
coplanar waveguides; microswitches; microwave switches; redundancy; CPW configuration; DC actuations; RF MEMS capacitive switches; coplanar waveguide; electrical requirements; microwave performances; ohmic switches; redundancy logic purpose; reliability; space redundancy configurations; Insertion loss; Loss measurement; Micromechanical devices; Radio frequency; Redundancy; Voltage measurement;
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013 Symposium on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4673-4477-7
