• DocumentCode
    618990
  • Title

    An interface ASIC of quartz vibratory gyroscope with 0.8°/hour root Allan variance

  • Author

    Qingyi Wang ; Weiping Chen ; Liang Yin ; Xiaowei Liu ; He Zhang

  • Author_Institution
    MEMS Center, Harbin Inst. of Technol., Harbin, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    498
  • Lastpage
    501
  • Abstract
    This paper analyzed the factor of bias drift of quartz vibratory gyroscope, proposed the method of improving bias stability of quartz vibratory gyroscope and designed an interface ASIC of quartz vibratory gyroscope. The bias instability is generated by characteristic of noise in the detecting circuit and the quantity of the driving single in the exciting circuit. We propose a sine-wave exciting circuit which has lower phase noise than the traditional exciting approach. An operational amplifier with low noise and offset voltage temperature coefficient is designed to decrease the bias instability. The interface ASIC integrated on a 5×4.4 mm2 chip with 0.5 μm CMOS process has 40mW power supply, 18nV/Hz1/2 equivalent input noise density, and 0.8°/hour root Allan variance.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; detector circuits; gyroscopes; integrated circuit design; operational amplifiers; phase noise; CMOS process; bias drift factor analysis; bias instability; bias stability; detecting circuit; equivalent input noise density; interface ASIC; noise characteristic; offset voltage temperature coefficient; operational amplifier; phase noise; power 40 mW; quartz vibratory gyroscope; root Allan variance; sine-wave exciting circuit; size 0.5 mum; Application specific integrated circuits; Circuit stability; Force; Gyroscopes; Noise; Preamplifiers; Stability analysis; ASIC; bias instability; quartz vibratory gyroscope;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559779
  • Filename
    6559779