• DocumentCode
    619059
  • Title

    Reliability evaluation of micromirror of double S-shaped unimorph piezoelectric actuator with probabilistic approach

  • Author

    Wenjing Liu ; Yongming Tang ; Baoping Wang

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    This paper presents the long time reliability evaluation of a micromirror with double S-shaped unimorph piezoelectric (dSUP) actuator design using a probabilistic approach. The lifetime (number of cycles to failure) of the piezoelectric actuator, electrical strength, and electrical load are considered as the random variables; and their probability distributions are discussed. The interference model of electrical load and electrical strength is used to evaluate the reliability of dSUP actuators. By this approach, the relationship between the reliability and the lifetime of the dSUP actuator has been deduced.
  • Keywords
    light interference; micromirrors; optical design techniques; piezoelectric actuators; probability; random processes; reliability; dSUP actuators; double S-shaped unimorph piezoelectric actuator; electrical load; electrical strength; failure; interference model; lifetime; long time reliability evaluation; micromirror; probabilistic method; probability distributions; random variables; Micromirrors; Piezoelectric actuators; Probabilistic logic; Probability density function; Probability distribution; Reliability; Micromirror; Piezoelectric Actuator; Probabilistic Approach; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559849
  • Filename
    6559849