DocumentCode
619059
Title
Reliability evaluation of micromirror of double S-shaped unimorph piezoelectric actuator with probabilistic approach
Author
Wenjing Liu ; Yongming Tang ; Baoping Wang
Author_Institution
Sch. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
fYear
2013
fDate
7-10 April 2013
Firstpage
813
Lastpage
816
Abstract
This paper presents the long time reliability evaluation of a micromirror with double S-shaped unimorph piezoelectric (dSUP) actuator design using a probabilistic approach. The lifetime (number of cycles to failure) of the piezoelectric actuator, electrical strength, and electrical load are considered as the random variables; and their probability distributions are discussed. The interference model of electrical load and electrical strength is used to evaluate the reliability of dSUP actuators. By this approach, the relationship between the reliability and the lifetime of the dSUP actuator has been deduced.
Keywords
light interference; micromirrors; optical design techniques; piezoelectric actuators; probability; random processes; reliability; dSUP actuators; double S-shaped unimorph piezoelectric actuator; electrical load; electrical strength; failure; interference model; lifetime; long time reliability evaluation; micromirror; probabilistic method; probability distributions; random variables; Micromirrors; Piezoelectric actuators; Probabilistic logic; Probability density function; Probability distribution; Reliability; Micromirror; Piezoelectric Actuator; Probabilistic Approach; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location
Suzhou
Electronic_ISBN
978-1-4673-6351-8
Type
conf
DOI
10.1109/NEMS.2013.6559849
Filename
6559849
Link To Document