DocumentCode :
619130
Title :
Tunable graphene nanomesh semiconductor: Design, fabrication, and characterization
Author :
Al-Mumen, Haider ; Fubo Rao ; Lixin Dong ; Wen Li
Author_Institution :
Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
1127
Lastpage :
1130
Abstract :
This paper reported a technique for tuning graphene semiconductor properties by introducing nanoholes into single- and few-layer graphene films. A simple nanofabrication technique has been demonstrated for making periodic nanoholes on pristine graphene in a mask-free and time-efficient manner via direct e-beam writing which was done by simply scanning the graphene area that is covered with EBL resist and then etching the scanned area by oxygen plasma. Parameters of e-beam lithography (EBL) (acceleration voltage, beam current, EBL resist thickness, and scanning area) were fine-tuned to optimize the dimensions of the nanomesh. Finally, Graphene field effect transistors were fabricated and characterized experimentally.
Keywords :
electron beam lithography; elemental semiconductors; field effect transistors; graphene; nanofabrication; nanostructured materials; semiconductor thin films; sputter etching; C; EBL resist thickness; acceleration voltage; beam current; direct e-beam writing; e-beam lithography; few-layer graphene films; graphene field effect transistors; graphene nanomesh semiconductor; nanofabrication; oxygen plasma etching; periodic nanoholes; pristine graphene; single-layer graphene films; Etching; Fabrication; Graphene; Resists; Substrates; Transistors; Voltage measurement; graphene; nanomesh; transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
Type :
conf
DOI :
10.1109/NEMS.2013.6559920
Filename :
6559920
Link To Document :
بازگشت