• DocumentCode
    61998
  • Title

    Use of Two Planar Gratings to Measure 3-DOF Displacements of Planar Moving Stage

  • Author

    Yongmeng Liu ; Maoqiang Yuan ; Jieru Cao ; Jiwen Cui ; Jiubin Tan

  • Author_Institution
    Harbin Inst. of Technol., Harbin, China
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    163
  • Lastpage
    169
  • Abstract
    This paper presents a 3-DOF displacement (x, y, Rz) measurement method for planar moving stage based on two planar gratings. The measurement system consists of two planar gratings placed in a diagonal line of a planar moving stage while each planar grating can acquire 2-D displacement measurement at one time. The mathematical model is then established to calculate 3-DOF displacements of a planar moving stage according to four outputs of two planar gratings. The presented measurement method not only solves the mounting inconvenience of using three 1-D linear gratings but also calculates and compensates the assembly misalignment errors by mathematical model itself. Experiments are carried out to prove the superiority of the presented measurement method. Experimental results indicate that the presented method can reduce the coupling errors in x and y directions approximately by three and 15 times, respectively, compared with the method of using three 1-D linear gratings. It can be concluded that the presented measurement method can be effectively used to achieve 3-DOF displacement for planar moving stage.
  • Keywords
    displacement measurement; measurement systems; 1D linear gratings; 3-DOF displacements; assembly misalignment errors; mathematical model; measurement method; planar gratings; planar moving stage; Couplings; Detectors; Displacement measurement; Gratings; Measurement uncertainty; Semiconductor device measurement; 3-DOF displacement; coupling error; error compensation; measurement method; planar grating; planar grating.;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2014.2329742
  • Filename
    6840328