• DocumentCode
    620486
  • Title

    Fault diagnosis of the TE process based on discrete hidden Markov model

  • Author

    Zhang Hui ; Fang Hua-jing ; Lisha Xia

  • Author_Institution
    Dept. of Control Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2013
  • fDate
    25-27 May 2013
  • Firstpage
    4343
  • Lastpage
    4346
  • Abstract
    It turns out that a prerequisite to widespread deployment of condition-based maintenance (CBM) technology and practice in industry is effective fault diagnosis and prognosis. Diagnosis is an assessment about the current health of a system based on observed symptoms. Prognosis is to predict the progression of a fault condition to system failure and estimate the remaining useful life (RUL) of the system. Consequently diagnosis is essential to security maintenance of the industry process. This paper presents a method based on discrete hidden Markov model (DHMM) for carrying out diagnosis. The proposed method was validated on a chemical process-the Tennessee Eastman process. The result indicates the effectiveness of this method.
  • Keywords
    chemical engineering; condition monitoring; discrete systems; failure (mechanical); failure analysis; fault diagnosis; hidden Markov models; maintenance engineering; remaining life assessment; CBM technology; DHMM; TE process; Tennessee Eastman process; chemical process; condition-based maintenance technology; discrete hidden Markov model; fault condition progression; fault diagnosis; fault prognosis; industry process; remaining useful life estimation; security maintenance; system failure; Electronic mail; Fault diagnosis; Hidden Markov models; Industries; Maintenance engineering; Markov processes; Process control; Fault Diagnosis; Hidden Markov Model; Tennessee Eastman Process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2013 25th Chinese
  • Conference_Location
    Guiyang
  • Print_ISBN
    978-1-4673-5533-9
  • Type

    conf

  • DOI
    10.1109/CCDC.2013.6561715
  • Filename
    6561715