DocumentCode
620765
Title
Polarization inverted (0001) / (000-1) ScAIN film resonators operating in second overtone mode
Author
Suzuki, M. ; Yanagitani, Takahiko ; Odagawa, Hiroyuki
Author_Institution
Nagoya Inst. of Technol., Nagoya, Japan
fYear
2012
fDate
7-10 Oct. 2012
Firstpage
1
Lastpage
4
Abstract
Polarization-inverted multilayered structure can excite high overtone mode resonance. Resonant frequency of high order mode resonator is higher than that of 1st mode resonator even though entire film thickness is same. The film thickness of high order mode resonator is thicker in same operating frequency. Therefore, high order mode resonator is expected to have high power handling capability. Polarization are controlled by bottom surface properties in epitaxial films, but polarization inverted multilayer structure can not be fabricated. We obtained polarization inversion in ScAlN film by Al target sputtering with small amount of Al2O3 ingot. Thickness extensional mode electromechanical coupling coefficient kt of the ScAlN film was estimated to be 0.21. Two layered polarization inverted ScAlN film resonator was prepared in this deposition process. Suppression of 1st mode resonance and excitation of 2nd overtone mode resonance were observed.
Keywords
aluminium compounds; scandium compounds; surface acoustic wave resonators; Al2O3; ScAlN; electromechanical coupling; epitaxial films; film thickness; high order mode resonator; overtone mode resonance; polarization inverted film resonators; polarization inverted multilayer structure; polarization-inverted multilayered structure; resonance suppression; target sputtering; High overtone mode resonance; Ion beam irradiation; Polarization-inverted multi-layred films; ScAIN;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2012 IEEE International
Conference_Location
Dresden
ISSN
1948-5719
Print_ISBN
978-1-4673-4561-3
Type
conf
DOI
10.1109/ULTSYM.2012.0482
Filename
6562094
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