• DocumentCode
    625272
  • Title

    Optimization for timing-speculated circuits by redundancy addition and removal

  • Author

    Yuxi Liu ; Rong Ye ; Feng Yuan ; Qiang Xu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
  • fYear
    2013
  • fDate
    27-30 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Integrated circuits suffer from severe variation effects with technology scaling, making their timing behavior increasingly unpredictable. Timing speculation is a promising technique to tackle this problem with the help of online timing error detection and correction mechanisms. In this paper, we propose to use redundancy addition and removal (RAR) technique to optimize timing-speculated circuits. By intentionally removing wires on those frequently-exercised critical paths and replacing them with wires on less critical ones (if possible), the proposed technique is able to greatly reduce the timing error rate of the circuit and improve its overall throughput, as shown in our experimental results on various benchmark circuits.
  • Keywords
    integrated circuit reliability; RAR technique; correction mechanisms; critical paths; integrated circuits; online timing error detection; redundancy addition and removal technique; technology scaling; timing-speculated circuits; Delays; Error probability; Logic gates; Optimization; Throughput; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2013 18th IEEE European
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4673-6376-1
  • Type

    conf

  • DOI
    10.1109/ETS.2013.6569376
  • Filename
    6569376