Title :
A Current-Mode mm-Wave direct-conversion receiver with 7.5GHz Bandwidth, 3.8dB minimum noise-figure and +1dBm P1dB, out linearity for high data rate communications
Author :
Hao Wu ; Ning-Yi Wang ; Yuan Du ; Yen-Cheng Kuan ; Hsiao, Frank ; Sheau-Jiung Lee ; Ming-Hsien Tsai ; Chewn-Pu Jou ; Chang, Mau-Chung Frank
Author_Institution :
Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
A current-mode mm-wave direct-conversion receiver breaking trade-offs among bandwidth, NF and linearity is designed and realized in 65nm CMOS. The 60GHz receiver employs novel Frequency-staggered Series Resonance Common Source (FSRCS) stage to extend RF bandwidth with superior noise performance. The receiver´s current-mode operation offers excellent out-of-band blocker tolerance and linearity. With on-chip quadrature LO generations, the fabricated receiver simultaneously achieves minimal noise figure of 3.8dB, RF bandwidth of 7.5GHz, output P1dB of 1dBm, maximum conversion gain of 32dB, and IRR of -35dB. The receiver is capable of tolerating outof-channel blocker up to -9dBm at 3.5GHz away. It occupies silicon area of 1.3mm2 and draws 25.5mA from 1V supply.
Keywords :
CMOS integrated circuits; current-mode circuits; millimetre wave receivers; CMOS; FSRCS stage; RF bandwidth; bandwidth 7.5 GHz; conversion gain; current 25.5 mA; current-mode mm-wave direct-conversion receiver; fabricated receiver; frequency 3.5 GHz; frequency-staggered series resonance common source stage; gain 32 dB; high data rate communications; minimum noise-figure; noise figure; noise figure 3.8 dB; noise performance; on-chip quadrature LO generations; out of-channel blocker; out-of-band blocker tolerance; receiver current-mode operation; size 65 nm; voltage 1 V; Bandwidth; CMOS integrated circuits; Linearity; Mixers; Noise; Noise measurement; Receivers; 60GHz; CMOS integrated receiver; Frequency-staggered Series Resonance Common Source; blocker tolerant; current-mode; mm-Wave;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6059-3
DOI :
10.1109/RFIC.2013.6569530