DocumentCode :
625956
Title :
Experimental investigation on sheet electron beam transport with Electron Beam Measuring and Analyzing System developed in IECAS
Author :
Cunjun Ruan ; Qingsheng Li ; Shuzhong Wang ; Xiudong Yang ; Xunlei Wu ; Chongshan Li
Author_Institution :
Key Lab. of High Power Microwave Sources & Technol., Inst. of Electron., Beijing, China
fYear :
2013
fDate :
21-23 May 2013
Firstpage :
1
Lastpage :
2
Abstract :
Recently, a set of instrument named Electron Beam Measuring and Analyzing System (EBMAS) has being built in Institute of Electronics, Chinese Academy of Sciences (IECAS), which can be used to measure the dynamic parameters for the high power electron beam during its formation and transport for microwave vacuum electron devices. In this paper, the EBMAS with its measurement of cross section, current density, energy dispersion, and its three dimensional trajectory with data acquisition and processing system are introduced for the high power electron beam. Then, the instrument is used to measure and analyze the sheet electron beam transport and theirs Diocotron instabilities for the W-band sheet beam klystron developed in IECAS, the thorough experiment results are presented, and good agreement are obtained for the experiment and simulation results.
Keywords :
current density; data acquisition; electron beam focusing; electron beams; millimetre wave tubes; optical klystrons; particle beam dynamics; Diocotron instabilities; EBMAS; Electron Beam Measuring and Analyzing System; IECAS; Institute of Electronics Chinese Academy of Sciences; W-band sheet beam klystron; cross section measurement; current density; data acquisition; energy dispersion; high power electron beam; microwave vacuum electron devices; processing system; sheet electron beam transport; three dimensional trajectory; Density measurement; Electron beams; Instruments; Magnetic fields; Microwave measurement; Power measurement; Trajectory; Diocotron instabilities; EBMAS; WSBK; cross section; current density; sheet electron beam; transport;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
Type :
conf
DOI :
10.1109/IVEC.2013.6570895
Filename :
6570895
Link To Document :
بازگشت