• DocumentCode
    625997
  • Title

    Influence of the incident angle on energy dependence of a secondary electron emission yield

  • Author

    Bundaleski, N. ; Belhaj, M. ; Gineste, T. ; Teodoro, O.M.N.D.

  • Author_Institution
    Dept. de Fis., Univ. Nova de Lisboa, Caparica, Portugal
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A novel method for calculation of energy dependence of a secondary electron emission yield for different incidence angles is proposed. The model is based on the semi-empirical law for secondary electron yield and a Monte Carlo simulation of reflected primary energy. Initial tests show good agreement between the model and the experiment.
  • Keywords
    Monte Carlo methods; secondary electron emission; Monte Carlo simulation; energy dependence; incidence angles; reflected primary energy; secondary electron emission yield; semiempirical law; Abstracts; Electron emission; Erbium; Materials; Monte Carlo methods; Silver; Stress; Monte-Carlo simulation; electron emission; electron-solid interaction; semi-empirical formula;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6570958
  • Filename
    6570958
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=625997