DocumentCode
626176
Title
Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver
Author
Gineste, T. ; Belhaj, M. ; Bundaleski, N. ; Teodoro, O.M.N.D. ; Pons, Christiane ; Puech, J. ; Balcon, Nicolas
Author_Institution
DESP (Dept. Environ. SPatial), ONERA, Toulouse, France
fYear
2013
fDate
21-23 May 2013
Firstpage
1
Lastpage
2
Abstract
The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.
Keywords
electron emission; TEEY; electron incidence angle; incident energy; technical silver; total electron emission yield; Electron beams; Electron emission; Energy measurement; Materials; Pollution measurement; Silver; Surface morphology; Silver; backscattered electron; incidence angle effect on electron emission; multipactor effect; secondary electron emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location
Paris
Print_ISBN
978-1-4673-5976-4
Type
conf
DOI
10.1109/IVEC.2013.6571182
Filename
6571182
Link To Document