DocumentCode
626374
Title
Combinatorial Test Architecture Design Using Viewpoint Diagram
Author
Nishi, Yoshio ; Katayama, Takeo ; Yoshizawa, Shingo
Author_Institution
Univ. of Electrocommun., Tokyo, Japan
fYear
2013
fDate
18-22 March 2013
Firstpage
295
Lastpage
300
Abstract
Software test has recently been a large-scale and complicated artifact, as is the software itself. It is necessary to reduce huge combinatorial test cases. This paper focuses on reduction of test parameters and combinations in test architectural design. First we will mention the test architecture design phase in TDLC: Test Development Life Cycle. Second we will introduce NGT: Notation for Generic Testing, which is a set of concepts or notation for design of software test architecture. This paper shows four examples of test architecture design patterns: Interaction-Viewpoint Conversion pattern, Interaction Cluster Partitioning Pattern, Interaction Demotion Pattern and Interaction Necessity Analysis.
Keywords
program testing; software architecture; NGT; TDLC; architecture design pattern; combinatorial test architecture design; interaction cluster partitioning pattern; interaction demotion pattern; interaction necessity analysis; interaction-viewpoint conversion pattern; notation for generic testing; software test; software test architecture design; test combination reduction; test development life cycle; test parameter reduction; viewpoint diagram; Browsers; Computer architecture; Electronic mail; Planning; Software; Software testing; test architecture; test development life cycle; test viewpoint; combinatorial test; test design pattern; NGT;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location
Luxembourg
Print_ISBN
978-1-4799-1324-4
Type
conf
DOI
10.1109/ICSTW.2013.82
Filename
6571646
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