Modelling NEM relays for digital circuit applications

Author

Rana, Sohel ; Tian Qin ; Grogg, Daniel ; Despont, Michel ; Yu Pu ; Hagleitner, Christoph ; Pamunuwa, Dinesh

Author_Institution

Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK

fYear

2013

fDate

19-23 May 2013

Firstpage

805

Lastpage

808

Abstract

A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.

Keywords

electrodes; finite element analysis; logic design; nanoelectromechanical devices; relays; NEM-relay based logic design; circuit simulation; digital circuit applications; electromechanical beam actuation; finite-element simulation; key gate-level metric quantification; reduced-order model; surface electrode; Capacitors; Computational modeling; Integrated circuit modeling; Logic gates; Mathematical model; Read only memory; Relays;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2013 IEEE International Symposium on

Conference_Location

Beijing

ISSN

0271-4302

Print_ISBN

978-1-4673-5760-9

Type

conf

DOI

10.1109/ISCAS.2013.6571969

Filename

6571969