Title :
An empirical and statistical comparison of state-of-the-art sigma-delta modulators
Author :
de la Rosa, Jos M.
Author_Institution :
Inst. de Microelectron. de Sevilla, Univ. de Sevilla, Sevilla, Spain
Abstract :
This paper examines and compares the state of the art in ΣΔ Modulators from an empirical but systematic perspective. Statistical data extracted from more than 300 cutting-edge integrated circuits have been exhaustively analyzed to identify trends, design challenges, as well as the most efficient solutions proposed for different application scenarios in the frontiers of the ΣΔ modulation technique. The results of this study are presented as design guidelines in order to help designers to select the optimum ΣΔ architecture and circuit implementation for a given set of specifications.
Keywords :
integrated circuits; sigma-delta modulation; ΣΔ modulators; integrated circuits; state-of-the-art sigma-delta modulators; statistical data; Apertures; Bandwidth; Energy resolution; Modulation; Quantization (signal); Sigma-delta modulation; Topology;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6571974