Title :
A high resolution and high accuracy R-2R DAC based on ordered element matching
Author :
You Li ; Tao Zeng ; Degang Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Random mismatch errors in the resistor networks are one of the dominant nonlinearity sources for high resolution and high accuracy resistor DACs. This paper applies the theory of ordered element matching in a high resolution segmented R-2R DAC. It can achieve high matching accuracy by regrouping the resistors in the MSB array according to their resistance ranks obtained by the INL test. The implementation only requires adding some additional digital circuits to the typical design. A behavioral model of 18-bit segmented R-2R DAC is created in MATLAB. The statistical results show a significant resistor area reduction compared with state of the art.
Keywords :
circuit testing; digital-analogue conversion; network synthesis; resistors; statistical analysis; INL test; MATLAB; MSB array; digital circuit; dominant nonlinearity source; high resolution segmented R-2R DAC; ordered element matching; random mismatch error; resistor network; statistical analysis; word length 18 bit; Accuracy; Arrays; MATLAB; Mathematical model; Registers; Resistors; Standards;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6572256
