• DocumentCode
    627235
  • Title

    A learning system for detecting transformer internal faults

  • Author

    Saleh, Ahmed M. ; Hossain, Md Zakir ; Rabin, Md Jubayer Alam ; Kabir, A. N. M. Enamul ; Khan, Md Fazle Elahi ; Shahjahan, Md

  • Author_Institution
    Khulna Univ. of Eng. & Technol., Khulna, Bangladesh
  • fYear
    2013
  • fDate
    17-18 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Miniature transformer is one of the most important components of electronic devices. A serious failure of such kind of transformer may cause loss of time and money. This paper presents a learning system to recognize internal fault of such kind of transformer. The different kinds of faults are made to occur intentionally and data are collected at various conditions. The faults include turn to turn, winding to ground, and dielectric faults. The data are then processed and entered in the learning algorithms to recognize the type of fault. We devise a learning system to recognize the various types of faults. Several versions of learning algorithms such as standard back propagation, Levenberg-Marquardt, Bayesian regulation, Resilient back propagation, Gradient descent, One-step secant, Elman recurrent network are used. The result of Levenberg-Marquardt algorithm was found to be faster than that of other algorithms. Therefore it is suitable for real time fault detection.
  • Keywords
    backpropagation; electrical faults; power engineering computing; transformer windings; Bayesian regulation; Elman recurrent network; Levenberg-Marquardt algorithm; dielectric fault; electronic device; gradient descent method; learning system; one-step secant method; resilient back propagation; transformer internal fault detection; turn to turn fault; winding to ground fault; Biological neural networks; Circuit faults; Current transformers; Fault detection; Neurons; Training; Windings; Back propagation algorithm; Miniature transformer; fault detection; internal fault; neural network (NN);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Informatics, Electronics & Vision (ICIEV), 2013 International Conference on
  • Conference_Location
    Dhaka
  • Print_ISBN
    978-1-4799-0397-9
  • Type

    conf

  • DOI
    10.1109/ICIEV.2013.6572586
  • Filename
    6572586