DocumentCode
627783
Title
Low power magnetic flip-flop based on checkpointing and self-enable mechanism
Author
Chabi, Djaafar ; Weisheng Zhao ; Yue Zhang ; Klein, Jacques-Olivier ; Chappert, Claude
Author_Institution
IEF, Univ. Paris-Sud, Orsay, France
fYear
2013
fDate
16-19 June 2013
Firstpage
1
Lastpage
4
Abstract
Advanced computing systems suffer from high static power due to the rapidly rising leakage currents in deep submicron CMOS technology. Fast access non-volatile memories (NVM) are under intense investigation to be integrated in Flip-Flops or computing memories to allow system power-off in standby state and save power. Spin Torque Transfer MRAM (STT-MRAM) is considered the most promising NVM technology to address this issue thanks to its fast speed, low power, and infinite endurance. In this paper, we present a new design of magnetic flip-flop (MFF) based on STT-MRAM. By integrating multi-context data checkpointing and self-enable switching mechanisms, its overall power can be lowered further than conventional structures. We performed hybrid simulations to validate its functional behaviors and evaluate its performance by using an accurate STT-MRAM spice model and an industrial CMOS 40 nm design kit.
Keywords
CMOS memory circuits; MRAM devices; SPICE; circuit simulation; flip-flops; integrated circuit modelling; leakage currents; logic design; low-power electronics; MFF; NVM technology; STT-MRAM spice model; advanced computing system; computing memories; deep submicron CMOS technology; design kit; fast access nonvolatile memories; functional behavior; high static power; hybrid simulation; industrial CMOS; infinite endurance; leakage current; low power magnetic flip-flop; multicontext data checkpointing; power saving; self-enable switching mechanism; size 40 nm; spin torque transfer MRAM; standby state; system power-off; CMOS integrated circuits; Computer architecture; Flip-flops; Nonvolatile memory; Semiconductor device modeling; Switches; Switching circuits; Checkpointing; Flip-Flop; Low power; Non-volatile; Register; Rollback; STT-MRAM; Stochastic switching;
fLanguage
English
Publisher
ieee
Conference_Titel
New Circuits and Systems Conference (NEWCAS), 2013 IEEE 11th International
Conference_Location
Paris
Print_ISBN
978-1-4799-0618-5
Type
conf
DOI
10.1109/NEWCAS.2013.6573616
Filename
6573616
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