• DocumentCode
    628257
  • Title

    Error detector placement for soft computation

  • Author

    Thomas, Abu ; Pattabiraman, Karthik

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of British Columbia (UBC), Vancouver, BC, Canada
  • fYear
    2013
  • fDate
    24-27 June 2013
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    The scaling of Silicon devices has exacerbated the unreliability of modern computer systems, and power constraints have necessitated the involvement of software in hardware error detection. At the same time, emerging workloads in the form of soft computing applications, (e.g., multimedia applications) can tolerate most hardware errors as long as the erroneous outputs do not deviate significantly from error-free outcomes. We term outcomes that deviate significantly from the error-free outcomes as Egregious Data Corruptions (EDCs). In this study, we propose a technique to place detectors for selectively detecting EDC causing errors in an application. We performed an initial study to formulate heuristics that identify EDC causing data. Based on these heuristics, we developed an algorithm that identifies program locations for placing high coverage detectors for EDCs using static analysis.We evaluate our technique on six benchmarks to measure the EDC coverage under given performance overhead bounds. Our technique achieves an average EDC coverage of 82%, under performance overheads of 10%, while detecting 10% of the Non-EDC and benign faults.
  • Keywords
    image coding; program diagnostics; software fault tolerance; average EDC coverage measurement; benign fault detection; computer system unreliability; egregious data corruptions; erroneou outputs; error detector placement; error-free outcomes; hardware error detection; hardware error tolerance; heuristics; high-coverage detector placement; multimedia applications; nonEDC fault detection; performance overhead bounds; power constraints; program location identification; silicon device scaling; soft computation; static analysis; under performance overheads; Arrays; Benchmark testing; Decoding; Detectors; Hardware; Measurement; PSNR;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2013 43rd Annual IEEE/IFIP International Conference on
  • Conference_Location
    Budapest
  • ISSN
    1530-0889
  • Print_ISBN
    978-1-4673-6471-3
  • Type

    conf

  • DOI
    10.1109/DSN.2013.6575353
  • Filename
    6575353