• DocumentCode
    628412
  • Title

    A PoP structure to support I/O over 1000

  • Author

    Dyi-Chung Hu ; Chun-Ting Lin ; Ying-Chih Chan

  • Author_Institution
    Technol. Center, Unimicron Technol. Corp., Hinchu, Taiwan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    412
  • Lastpage
    416
  • Abstract
    PoP structure is widely used in mobile devices which memory package is directly attached to the top of the application processor. This structure, which has a smaller form factor and short interconnection distance between memory and processor chip. As the market demands more speed and bandwidth, the memory devices are moving from LPDDR to LPDDR3 and even wide I/O to support future requirements. Since wide I/O memory needs more than 1000 I/Os, the conventional PoP structure such as TMV with limited fine pitch capabilities up to 0.4 mm may not be able to support high I/O counts in the future. In this paper we propose a “Copper Pillar” structure in the peripheral area of the CSP package. For targeting 0.2 mm pitch copper pillars, 6 rows of interconnection on the peripheral of the bottom CSP package that can support 1224 I/Os. We have successfully making copper pillars with pitch as small as 0.2 mm and pillar height as high as 100 um. The PoP connection can be made through the solder ball on the bottom of the memory package to the copper pillar on top of processor substrate. In this paper, the process of making 0.2 mm pitch copper pillar will be discussed. And 0.2 mm PoP connection is demonstrated.
  • Keywords
    copper; electronics packaging; interconnections; memory architecture; mobile radio; solders; CSP package; Cu; I/O memory; LPDDR3; PoP structure; interconnection distance; market demands; memory chip; memory package; mobile devices; peripheral area; pitch copper pillar; processor chip; size 0.2 mm; solder ball; Assembly; Bandwidth; Copper; Random access memory; Resists; Substrates; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575604
  • Filename
    6575604