• DocumentCode
    628423
  • Title

    Solder joint properties of Sn-Ag-Cu solders on environmental-friendly plasma surface finish

  • Author

    Sang-Hyun Kwon ; Kyoung-Ho Kim ; Won-Il Seo ; Nam-Sun Park ; Young-Bae Park ; Chang-Woo Lee ; Sehoon Yoo

  • Author_Institution
    Adv. Welding & Joining Technol. Center, KITECH, Cheonan, South Korea
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    481
  • Lastpage
    485
  • Abstract
    Plasma coating for the surface finish of PCBs is a potential replacement of the conventional PCB finishes because of its environment-friendly process which does not produce any waster solution. In addition, the plasma surface finish enables to perform the multiple soldering over 5 times and shelf life is over 1 year. Corrosion properties of the plasma surface finish is higher than that of conventional surface finishes. In this study, solder joint properties were examined to understand the reliability of the plasma surface finish. Plasma surface finish was basically fluorine-based organic-inorganic composite thin films, which were deposited onto the Cu pads of a PCB. Sn-3.0Ag-0.5Cu (SAC305) solder was used as solder joint materials. Solder joint strength of the plasma finish sample was similar to that of the OSP finished sample. Plasma finishes had slightly higher brittle fracture rate after the multiple reflow test than OSP finish. In addition, plasma finish had higher corrosion resistance than OSP after a salt spray test.
  • Keywords
    copper alloys; corrosion; environmental factors; fracture; plasma materials processing; printed circuits; silver alloys; solders; tin alloys; OSP; PCB; SnAgCu; brittle fracture rate; corrosion properties; corrosion resistance; environmental-friendly plasma surface finish; organic-inorganic composite thin films; plasma coating; salt spray test; solder joint materials; solder joint properties; waster solution; Corrosion; Plasma properties; Soldering; Surface finishing; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575615
  • Filename
    6575615