• DocumentCode
    628482
  • Title

    Power comparison of 2D, 3D and 2.5D interconnect solutions and power optimization of interposer interconnects

  • Author

    Karim, M.A. ; Franzon, Paul D. ; Kumar, Ajit

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    860
  • Lastpage
    866
  • Abstract
    This paper compares the power efficiency of multiple 2D, 2.5D and 3D interconnect scenarios, specifically DDR3 with PCB, DDR3 with interposers, LPDDR2(3) with POP, wide I/Os with through-silicon vias (TSVs) and interposers and 32 nm technology CMOS drivers with TSVs and on-chip wires. It was found that DDR3 with PCB is the lowest power efficiency (15.65 mW/Gbps) and custom designed CMOS drivers optimized for the 2.5D and 3D give the highest power efficiency (0.23mW/Gbps). Optimization of a Back End of the Line (BEOL) 65 nm interposer interface is also presented for Wide IO interface to find maximize power efficiency. Power efficiency for different interposer trace lengths (5mm-40mm) and pitches (4.6μm-11.05μm) was analyzed. It was found that power efficiency decreases linearly with the increase of pitch and length of the interposer traces both in one stack and 4 stack die of Wide IO.
  • Keywords
    CMOS integrated circuits; interconnections; optimisation; three-dimensional integrated circuits; 2.5D interconnect solution; 2D interconnect solution; 3D interconnect solution; BEOL; CMOS driver; DDR3; LPDDR2; PCB; POP; TSV; interposer interconnection; optimization; power efficiency; power optimization; size 32 mm; size 4.6 mum to 11.05 mum; size 65 nm; stack die; through-silicon-vias; wide I/O; CMOS integrated circuits; Capacitors; Electrostatic discharges; Integrated circuit interconnections; Receivers; Simulation; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575674
  • Filename
    6575674