• DocumentCode
    628516
  • Title

    System level signal and power integrity analysis for 3200Mbps DDR4 interface

  • Author

    Feng, Jianjiang ; Dhavale, Bipin ; Chandrasekhar, Janani ; Tretiakov, Yuri ; Oh, Dan

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1081
  • Lastpage
    1086
  • Abstract
    For single-ended signaling DDR4 channels at 3200Mbps, signal and power integrity issues become increasingly challenging with much smaller voltage and timing windows to balance the budget. As systems increase data rate and IO count, supply noise does not scale accordingly. We present a system level signal and power co-simulation analysis to optimize system performance under stringent timing requirement [1]. Signal integrity of DDR4 interface, such as inter-symbol interference ISI, reflection, and signal cross talk, needs to be minimized in order to meet an ever shrinking timing budget. Also, power delivery network (PDN) design becomes very difficult as a result of smaller die size and multilayer complex package design. SI and PI co-design optimization is driven by both channel performance and overall system cost.
  • Keywords
    DRAM chips; electronics packaging; noise; optimisation; DDR4 channels; DDR4 interface; PDN design; bit rate 3200 Mbit/s; channel performance; codesign optimization; multilayer complex package design; power cosimulation analysis; power delivery network; power integrity analysis; supply noise; system level signal; Correlation; Crosstalk; Frequency measurement; Impedance; Noise; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575708
  • Filename
    6575708