DocumentCode :
628543
Title :
Effect of strain rate on adhesion strength of Anisotropic Conductive Film (ACF) joints
Author :
Meng, Jianhui ; Stark, Philipp ; Dasgupta, Avirup ; Sillanpaa, M. ; Hussa, E. ; Seppanen, Jukka P. ; Raunio, Jouni A. ; Saarinen, Ilkka J.
Author_Institution :
Mech. Eng. Dept., Univ. of Maryland, College Park, MD, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1252
Lastpage :
1258
Abstract :
Advantages of Anisotropic Conductive Films (ACF) technology, especially the low bonding temperature, fine pitch capability, elimination of lead and low cost, have resulted in ACF interconnects being widely used in contemporary portable electronic devices. Such products are exposed to various types of mechanical loadings, such as shock and impact during handling and accidental drops, throughout their life-cycle. Such impacts involve a risk of a mechanical damage to the electronic components and their interconnections to the PWAs inside the product housing. Evidence indicates that damage to the ACF matrix can directly result in instability of the contact resistance of the bonding. This study evaluates the ACF adhesive strength under mechanical loading conditions. ACF adhesive strength with three selected width and pitch, two kinds of surface finishes: ENIG and OSP surface finish is studied at different dynamic load velocities for tensile and shear tests. ACF/ENIG interface is found to exhibit higher adhesion strength than ACF/OSP interface. Furthermore, some rate dependency in adhesive strength is observed. ACF adhesion strength is captured in a rate-dependent traction-separation constitutive response in Finite Element (FE) Cohesive Zone Models (CZM), to model the damage initiation and evolution in the ACF during tensile and shear tests.
Keywords :
adhesive bonding; conductive adhesives; fine-pitch technology; finite element analysis; integrated circuit interconnections; surface finishing; tensile testing; ACF adhesive strength; ACF interconnects; ACF joints; CZM; ENIG surface finish; FE; OSP surface finish; PWA; adhesion strength; anisotropic conductive film joints; cohesive zone models; fine pitch capability; finite element; low bonding temperature; mechanical loading conditions; mechanical loadings; portable electronic devices; product housing; shear tests; strain rate; tensile tests; traction-separation constitutive response; Bonding; Force; Loading; Strain; Surface cracks; Surface finishing; Surface morphology; ACF; Adhesion Strength; Adhesives; Cohesive Element; Cohesive Zone Models; ENIG; Finite Element Analysis; OSP;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575735
Filename :
6575735
Link To Document :
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