DocumentCode
628571
Title
Drop impact simulation and experimental validation on high power light emitting diodes modules
Author
Cao Li ; Tao Peng ; Xuefang Wang ; Mingxiang Chen ; Sheng Liu
Author_Institution
Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2013
fDate
28-31 May 2013
Firstpage
1446
Lastpage
1451
Abstract
Impact behaviors of high-power LED are essential due to the possible poor adhesion of interfaces and should be studied. In this study, the analysis of dynamic response for high-power LED module under impact load is conducted with simplified theoretical analysis, experimental testing and numerical simulation. A self-made microelectronics drop impact tester is established. Then reliability performances of high power LED module subjected to drop test conditions are evaluated experimentally. Good reproducibility dynamic parameters of impact force-time, acceleration-time are recorded for evaluating the impact response through the signal processing. In addition, a theoretical analysis of the impact dynamic progress is conduced, which shows the self-made drop tester is relatively precise by comparing the theoretical and experimental results. The major failure modes of LED module include lens fall off and crack formation in the impact experiment. The numerical simulation is conducted by nonlinear FEA software ABAQUS for high-power LED drop impact process under different drop angle conditions. Because the drop impact is a transient dynamic process, the constitutive relations of solder material under high strain rate are taken into consideration. The purpose of numerical simulation is to obtain the distribution of local stress and deformation under drop impact process, which is significant for comprehensive and in-depth understanding for high-power LED module drop impact response.
Keywords
adhesion; cracks; deformation; integrated circuit reliability; light emitting diodes; numerical analysis; signal processing; solders; stress analysis; ABAQUS; LED module; crack formation; deformation distribution; drop impact simulation; dynamic response analysis; experimental testing; experimental validation; failure mode; impact behavior; impact response evaluation; interface adhesion; lens fall off; light emitting diodes module; local stress distribution; nonlinear FEA software; numerical simulation; reliability performance; reproducibility dynamic parameter; self-made microelectronics drop impact tester; signal processing; solder material; strain rate; theoretical analysis; transient dynamic process; Acceleration; Force; Lenses; Light emitting diodes; Materials; Reliability; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location
Las Vegas, NV
ISSN
0569-5503
Print_ISBN
978-1-4799-0233-0
Type
conf
DOI
10.1109/ECTC.2013.6575763
Filename
6575763
Link To Document