• DocumentCode
    628601
  • Title

    High performance plastic molded QFN package with ribbon bonding and a defective PCB ground

  • Author

    Yi-Chieh Lin ; Wen-Hsian Lee ; Tzyy-Sheng Horng ; Lih-Tyng Hwang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1644
  • Lastpage
    1649
  • Abstract
    An interconnect transition within the plastic mold is formed between the output ports of the IC sitting on top of a Quad Flat Non-leaded (QFN) package and the nearby I/O leads of the package. This paper describes the design and development of a cost-effective interconnect transition structure for improving the operating frequency of the package up to millimeter-wave range. In addition to adopting ribbon bonds, which have been shown to exhibit a lower insertion loss, a novel Defective Ground Structure (DGS) has been used to compensate the ribbon bond´s imaginary part of impedance (the parasitic capacitive from the I/O pad), thus, achieving superior bandwidth performance. By employing the ribbon bonds and the DGS structures; the measured results of QFN package is able to achieve S21 at -1.5dB up to 62.3 GHz, and S11 less than -10 dB up to 66 GHz.
  • Keywords
    defected ground structures; integrated circuit interconnections; integrated circuit packaging; plastic packaging; printed circuits; DGS structures; I/O leads; I/O pad; IC sitting; bandwidth performance; cost-effective interconnect transition structure; defective PCB ground; defective ground structure; insertion loss; millimeter-wave range; operating frequency; output ports; parasitic capacitive; performance plastic molded QFN package; quad flat non-leaded package; ribbon bonding; ribbon bonds; Bonding; Frequency measurement; Impedance; Insertion loss; Loss measurement; Resistance; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575793
  • Filename
    6575793