• DocumentCode
    628709
  • Title

    Buffered distributed spray MOCVD reactor for LED production

  • Author

    Shaolin Hu ; Zhiyin Gan ; Sheng Liu

  • Author_Institution
    State Key Lab. for Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci & Tech, Wuhan, China
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    2286
  • Lastpage
    2291
  • Abstract
    In this paper we present design of a novel buffered distributed spray (BDS) MOCVD reactor, which is characterized by vertical distributed spray and horizontal radical flows. Theoretical studies have been performed about the reaction mechanisms of GaN films based on computational fluid dynamics (CFD) simulation to investigate the performance of the BDS reactor. Furthermore, we present the secondary ion mass spectroscopy (SIMS), transmission electron microscopy (TEM), X-ray diffraction (XRD) and photoluminescence (PL) test results to evaluate the quality of the LED epitaxial layers and the performance of the MOCVD system with BDS reactor. The results show that this system is of high performance for LED production, especially in the uniformity of growth rate, sharp interfaces in the MQWs structure and growth repeatability.
  • Keywords
    III-V semiconductors; MOCVD; X-ray diffraction; chemical reactors; computational fluid dynamics; gallium compounds; light emitting diodes; photoluminescence; secondary ion mass spectra; sprays; transmission electron microscopy; wide band gap semiconductors; BDS MOCVD reactor; CFD simulation; GaN; LED epitaxial layers; LED production; MQW structure; PL test; SIMS; TEM; X-ray diffraction; XRD; buffered distributed spray metal-organic chemical vapor deposition reactor; computational fluid dynamics simulation; horizontal radical flows; photoluminescence test; secondary ion mass spectroscopy; transmission electron microscopy; vertical distributed spray; Epitaxial layers; Gallium nitride; Inductors; Light emitting diodes; MOCVD; Quantum well devices; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575902
  • Filename
    6575902