DocumentCode
629148
Title
RTN induced frequency shift measurements using a ring oscillator based circuit
Author
Qianying Tang ; Xiaofei Wang ; Keane, John ; Kim, Chul Han
Author_Institution
Dept. of ECE, Univ. of Minnesota, Minneapolis, MN, USA
fYear
2013
fDate
11-13 June 2013
Abstract
The impact of random telegraph noise on ring oscillator (ROSC) frequency was measured for the first time using an on-chip beat frequency detection system. The proposed differential sensing scheme achieves a high frequency measurement resolution (>0.01%) at a short sampling time (>1μs) allowing efficient collection of RTN induced frequency shifts. Experimental data from a ROSC array fabricated in a 65nm LP process display both single trap and multi-trap RTN behavior. The voltage dependencies of the frequency shift and capture/emission times were measured and analyzed.
Keywords
circuit noise; oscillators; telegraphy; ROSC frequency; RTN induced frequency shift measurements; on-chip beat frequency detection system; random telegraph noise; ring oscillator based circuit; size 65 nm; Arrays; Noise; Semiconductor device measurement; System-on-chip; Time measurement; Time-frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology (VLSIT), 2013 Symposium on
Conference_Location
Kyoto
ISSN
0743-1562
Print_ISBN
978-1-4673-5226-0
Type
conf
Filename
6576647
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