• DocumentCode
    629644
  • Title

    Stimulus-response tests: An applied demonstration: Demonstration paper

  • Author

    Matheus, Carolyn C. ; Svegliato, Justin

  • Author_Institution
    Dept. of Comput. Technol., Marist Coll., Poughkeepsie, NY, USA
  • fYear
    2013
  • fDate
    29-31 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Stimulus-Response (S-R) tests capture automatic reactions to stimuli, providing a unique way to acquire information about unconscious perception. S-R tests are applicable in multiple disciplines, including experimental biology, neuro-informatics, and social and behavioral sciences. In many computer-based S-R tests, users sort stimuli (e.g., images or text) into different categories using designated keys on the keyboard. Response times can be recorded in different intervals (e.g., milliseconds). The error rate and speed in completing tasks provide a foundation for measuring underlying variables. The current research will demonstrate a prototype of a S-R research tool applied to the field of social and behavioral sciences, including the demonstration of: a computer-based S-R test and code; scripting for automatically generating and assigning user identifications, tracking and assigning users to different conditional groups, and automatically forwarding users to external websites; and procedures for collecting and exporting data.
  • Keywords
    Web sites; cognition; neurophysiology; psychology; S-R research tool; automatic reactions; behavioral sciences; computer-based S-R tests; conditional groups; data collection; data exporting; error rate; experimental biology; external Web sites; keyboard; neuroinformatics; response times; scripting; social sciences; stimulus-response tests; unconscious perception; user identifications; user tracking; Computers; Educational institutions; Error analysis; Open source software; Prototypes; Psychology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research Challenges in Information Science (RCIS), 2013 IEEE Seventh International Conference on
  • Conference_Location
    Paris
  • ISSN
    2151-1349
  • Print_ISBN
    978-1-4673-2912-5
  • Type

    conf

  • DOI
    10.1109/RCIS.2013.6577740
  • Filename
    6577740