Title :
Low power secure AES S-box using adiabatic logic circuit
Author :
Monteiro, Carlos ; Takahashi, Y. ; Sekine, Taku
Author_Institution :
Grad. Sch. of Eng., Gifu Univ., Gifu, Japan
Abstract :
Numerous works on advanced encryption standard (AES) S-box architecture have been done using composite field arithmetic in Galois field. However, to the best of our knowledge, less information is available on both a secure circuit and the low power consumption. In this work, we implement our previous proposed charge-sharing symmetric adiabatic logic (CSSAL) in an 8-bit S-box circuit using multi-stage positive polarity Reed-Muller (PPRM) representation over composite field technique. The logic sharing method for frequently same logic function usage in the combination logic is applied. Consequently, the low-complexity, high resistive and the low-power consumption are achieved. The results in this paper are obtained from the SPICE simulation with 0.18-μm 1.8-V standard CMOS technology at operating frequency of 1.25-70 MHz. Base on the logic speed, security performance and low-power requirement, we deduce that our proposed logic is applicable for contactless smart cards, RFID tags, and wireless sensors.
Keywords :
CMOS logic circuits; Galois fields; Reed-Muller codes; combinational circuits; cryptography; power consumption; radiofrequency identification; smart cards; CMOS technology; CSSAL; Galois field; PPRM representation; RFID tags; S-box circuit; SPICE simulation; adiabatic logic circuit; charge-sharing symmetric adiabatic logic; combination logic circuit; composite field technique; contactless smart cards; encryption standard S-box architecture; frequency 1.25 MHz to 70 MHz; logic function; logic sharing method; logic speed; low power secure AES S-box; multistage positive polarity Reed-Muller representation; power consumption; security performance; wireless sensors; word length 8 bit; CMOS integrated circuits; Cryptography; Power demand; Resistance; Semiconductor device modeling; Smart cards; Standards;
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-6105-7
DOI :
10.1109/FTFC.2013.6577751