Title :
Analysis of low-voltage mixed-signal circuits under device variations
Author :
Zarkesh-Ha, Payman
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
Aggressive supply voltage scaling has become the most effective way to reduce power dissipation in today´s mobile battery-powered electronic circuits. However, extreme sensitivity to device variations in low-voltage electronics has made design of such systems extremely complicated. In this paper, a new analytical model for device variations is derived. Based on the new model, the impact of device variations on low-voltage analog and digital circuits in a projected 22nm process technology is investigated.
Keywords :
CMOS analogue integrated circuits; CMOS digital integrated circuits; integrated circuit design; low-power electronics; mixed analogue-digital integrated circuits; power aware computing; power supply circuits; CMOS process technology; aggressive supply voltage scaling; device variation; low-voltage analog circuit; low-voltage digital circuit; low-voltage electronics; low-voltage mixed-signal circuit analysis; mobile battery-powered electronic circuit; power dissipation; size 22 nm; Analytical models; Delays; Digital circuits; Integrated circuit modeling; Inverters; Mathematical model; Semiconductor device modeling; analog and digital circuits; low-power; low-voltage; mixed-signal; variations;
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-6105-7
DOI :
10.1109/FTFC.2013.6577756
