• DocumentCode
    630048
  • Title

    Scalable 3D-FPGA using wafer-to-wafer TSV interconnect of 15 Tbps/W, 3.3 Tbps/mm2

  • Author

    Furuta, F. ; Matsumura, Takeshi ; Osada, K. ; Aoki, Masaki ; Hozawa, K. ; Takeda, Kenji ; Miyamoto, Naoyuki

  • Author_Institution
    3D-Integration Technol. Res. Dept., Assoc. of Super-Adv. Electron. Technol. (ASET), Tokyo, Japan
  • fYear
    2013
  • fDate
    12-14 June 2013
  • Abstract
    A “scalable 3D-FPGA” using TSV interconnects is proposed. This FPGA was designed on the basis of homogeneous 3D-stacking to extend the logic scale in proportion to the number of stacked layers. To improve Z-axis transmission performance, a wafer-to-wafer stacking process for lowering the capacitance of TSV was developed. An “embedded TSV“ design for the shorter on-chip wirings was also devised. Moreover, to reduce the clock skew between the stacked layers arising from global process variations, a 3D clock-synchronization scheme using a reference clock via TSVs was developed. To check connectivity between layers and improves its reliability, test and redundant circuits were embedded into the FPGA. We present the first demonstration of two stacked FPGA layers by using wafer-to-wafer via-last Cu-TSV process. Z-axis transmission performance was the highest, namely, 15 Tbps/W and 3.3 Tbps/mm2. The clock skew between two layers was reduced by 60% using the new clock scheme.
  • Keywords
    copper; field programmable gate arrays; integrated circuit interconnections; 3D clock-synchronization scheme; Cu; Z-axis transmission performance; embedded TSV design; homogeneous 3D-stacking; on-chip wirings; reference clock; scalable 3D-FPGA; stacked FPGA layers; wafer-to-wafer TSV interconnect; wafer-to-wafer stacking process; wafer-to-wafer via-last copper-TSV process; Clocks; Delays; Field programmable gate arrays; Integrated circuit interconnections; Stacking; Through-silicon vias; Tiles; 3D; FPGA; Homogeneous; TSV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2013 Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-5531-5
  • Type

    conf

  • Filename
    6578713