DocumentCode
630169
Title
Noise analysis and measurement of integrator-based sensor interface circuits for fluorescence detection in lab-on-a-chip applications
Author
Jensen, Karl A. ; Gaudet, Vincent C. ; Levine, P.M.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2013
fDate
24-28 June 2013
Firstpage
1
Lastpage
4
Abstract
This paper examines the impact of integrator-based sensor interface circuit parameters, optical parameters, and noise on the limit of detection (LOD) of a fluorescence measurement lab-on-a-chip (LOC) device. Fluorescence detection is a powerful form of signal measurement for LOC-based bio-diagnostic assays. Reduction of the LOD enables a lower concentration of analyte to be measured, diversifying applications of LOC technology. An optical system model of a proposed LOC device is described. This device contains a photodiode and a capacitive transimpedance amplifier (CTIA) sensor interface constructed in a standard complementary metal-oxide-semiconductor (CMOS) technology. Analysis of the noise produced by the interface electronics and photodiode is then carried out, enabling the LOD of the system to be parametrized. The impact of circuit and system parameters on the LOD is then evaluated and compared to simulated and measured results.
Keywords
CMOS integrated circuits; lab-on-a-chip; noise measurement; photodiodes; CMOS technology; CTIA; LOC device; LOD; biodiagnostic assays; capacitive transimpedance amplifier; fluorescence detection; fluorescence measurement; integrator-based sensor interface circuit parameters; interface electronics; lab-on-a-chip applications; limit of detection; noise analysis; noise measurement; optical system model; photodiode; signal measurement; standard complementary metal-oxide-semiconductor technology; Biomedical optical imaging; Integrated circuit modeling; Integrated optics; Noise; Operational amplifiers; Optical sensors; Photodiodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location
Montpellier
Print_ISBN
978-1-4799-0668-0
Type
conf
DOI
10.1109/ICNF.2013.6578905
Filename
6578905
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