DocumentCode
630236
Title
Efficient noise extraction algorithm and wideband noise measurement system from 0.3 GHz to 67 GHz
Author
Nguyen, Hien ; Misljenovic, Neven ; Hosein, Bryan
Author_Institution
Focus Microwaves Inc., Dollard-des-Ormeaux, QC, Canada
fYear
2013
fDate
7-7 June 2013
Firstpage
1
Lastpage
2
Abstract
An efficient and accurate noise parameter statistical extraction algorithm is proposed and validated experimentally using a high performance Silicon MOSFET transistor. The proposed algorithm is applicable to most devices with high input reflection coefficients and operating over wide bandwidth. Measured data agree well with theoretical expectation.
Keywords
MOSFET; electric noise measurement; elemental semiconductors; silicon; statistical analysis; Si; frequency 0.3 GHz to 67 GHz; high performance silicon MOSFET transistor; noise parameter statistical extraction algorithm; reflection coefficient; wideband noise measurement system; Data mining; MOSFET; Noise; Noise measurement; Parameter extraction; Silicon; Tuners; PNA-X; noise figure measurement; noise parameter extraction; tuner;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location
Seattle, WA
Print_ISBN
978-1-4673-4981-9
Type
conf
DOI
10.1109/ARFTG.2013.6579038
Filename
6579038
Link To Document