Title :
Efficient noise extraction algorithm and wideband noise measurement system from 0.3 GHz to 67 GHz
Author :
Nguyen, Hien ; Misljenovic, Neven ; Hosein, Bryan
Author_Institution :
Focus Microwaves Inc., Dollard-des-Ormeaux, QC, Canada
Abstract :
An efficient and accurate noise parameter statistical extraction algorithm is proposed and validated experimentally using a high performance Silicon MOSFET transistor. The proposed algorithm is applicable to most devices with high input reflection coefficients and operating over wide bandwidth. Measured data agree well with theoretical expectation.
Keywords :
MOSFET; electric noise measurement; elemental semiconductors; silicon; statistical analysis; Si; frequency 0.3 GHz to 67 GHz; high performance silicon MOSFET transistor; noise parameter statistical extraction algorithm; reflection coefficient; wideband noise measurement system; Data mining; MOSFET; Noise; Noise measurement; Parameter extraction; Silicon; Tuners; PNA-X; noise figure measurement; noise parameter extraction; tuner;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579038
