DocumentCode :
63371
Title :
Dynamic Indexing: Leakage-Aging Co-Optimization for Caches
Author :
Calimera, A. ; Loghi, Mirko ; Macii, E. ; Poncino, Massimo
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
Volume :
33
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
251
Lastpage :
264
Abstract :
Traditional implementations of low-power states based on voltage scaling or power gating have been shown to have a beneficial effect on the aging phenomena caused by negative bias temperature instability (NBTI), which can be explained in terms of the intuitive correlation between the idleness and the reduced workload of a system. Such a joint benefit has been exploited only partially because of the different nature of energy and aging as cost functions: as a performance figure, aging is affected by the worst idleness pattern. Therefore, large potential energy savings usually result in limited aging reductions. In this paper, we address this problem in the context of power-managed caches, which represent a critical target for NBTI-reduced aging: given their symmetric structure, SRAM structures are, in particular, sensitive to NBTI effects because they cannot take advantage of the value-dependent recovery typical of NBTI. We propose a strategy called dynamic indexing, in which the cache indexing function is changed over time in order to uniformly distribute the idleness over all the various power managed units (e.g., lines). This distribution allows fully using the leakage optimization potential and extending the lifetime of a cache. We explore various alternatives, in particular different granularities of the power managed units as well as different reindexing functions. Experimental analysis shows that it is possible to simultaneously reduce leakage power and aging in caches, with minimal power consumption overhead.
Keywords :
SRAM chips; ageing; cache storage; negative bias temperature instability; optimisation; NBTI effects; NBTI-reduced aging; SRAM structures; aging phenomena; aging reductions; cache indexing function; cache lifetime; dynamic indexing; leakage optimization potential; leakage-aging co-optimization; low-power states; negative bias temperature instability; power gating; power managed units; power-managed caches; reindexing functions; symmetric structure; value-dependent recovery; voltage scaling; worst idleness pattern; Aging; Computer architecture; Degradation; Indexing; Logic gates; Stress; Threshold voltage; Aging; caches; leakage power; memories; negative bias temperature instability (NBTI); reliability;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2013.2287187
Filename :
6714506
Link To Document :
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