• DocumentCode
    63385
  • Title

    Cross-Domain Model Building and Validation (CDMV): A New Modeling Strategy to Reinforce Understanding of Nanomanufacturing Processes

  • Author

    Li Wang ; Qiang Huang

  • Author_Institution
    Daniel J. Epstein Dept. of Ind. & Syst. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    10
  • Issue
    3
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    571
  • Lastpage
    578
  • Abstract
    Understanding nanostructure growth faces issues of limited data, lack of physical knowledge, and large process uncertainties. These issues result in modeling difficulty because a large pool of candidate models almost fit the data equally well. Through the Integrated Nanomanufacturing and Nanoinformatics (INN) strategy, we derive the process models from physical and statistical domains, respectively, and reinforce the understanding of growth processes by identifying the common model structure across two domains. This cross-domain model building strategy essentially validates models by domain knowledge rather than by (unavailable) data. It not only increases modeling confidence under large uncertainties, but also enables insightful physical understanding of the growth kinetics. We present this method by studying the weight growth kinetics of silica nanowire under two temperature conditions. The derived nanowire growth model is able to provide physical insights for prediction and control under uncertainties.
  • Keywords
    nanofabrication; nanowires; statistical analysis; INN strategy; cross-domain model building and validation; integrated nanomanufacturing and nanoinformatics; nanomanufacturing process; physical domain; silica nanowire; statistical domain; Absorption; Data models; Kinetic theory; Mathematical model; Nanobioscience; Silicon compounds; Uncertainty; Cross-domain modeling and validation; nanomanufacturing; nanostructure growth; physical mechanism selection;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2013.2243433
  • Filename
    6466395