DocumentCode :
633915
Title :
Failure analysis for via with solder bubble
Author :
Wang Yang ; Luo Daojun
Author_Institution :
Reliability Res. & Anal. Center, China CEPREI Lab., Guangzhou, China
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
770
Lastpage :
773
Abstract :
A failure PCBA sample with solder bubble problem and a bare PCB sample were analyzed with the aid of stereomicroscope and SEM and cross sections, Thermal stress test and solderability test were performed on the failure PCBA sample and the bare PCB sample. The cause of vias with solder bubbles in failure PCBA sample was found after systematic analysis, the failure was caused by the residual moisture or flux permeating inside the defects in barrel plating and dielectric material surrounding the hole venting and blasting out during high-temperature soldering. The defects around the vias should be induced by the improper drilling process. To achieve good drilling quality and avoiding the solder bubbles problem, drilling materials, drill thrust, quality of surface of vias and proper drilling equipment should be well selected and controlled.
Keywords :
dielectric materials; drilling; failure analysis; moisture; printed circuit testing; printed circuits; scanning electron microscopy; solders; SEM; bare PCB sample; barrel plating; dielectric material; drill thrust; drilling equipment; drilling materials; drilling process; failure PCBA sample; failure analysis; flux permeation; high-temperature soldering; residual moisture; solder bubble problem; solderability test; stereomicroscope; surface quality; thermal stress test; Electronics packaging; Reliability; PCBA; SEM; Solder bubbles; cross section; failure; via;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
ISSN :
1946-1542
Print_ISBN :
978-1-4799-1241-4
Type :
conf
DOI :
10.1109/IPFA.2013.6599274
Filename :
6599274
Link To Document :
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