• DocumentCode
    63560
  • Title

    Considering Crosstalk Effects in Statistical Timing Analysis

  • Author

    Qin Tang ; Zjajo, Amir ; Berkelaarand, Michel ; van der Meijs, Nick

  • Author_Institution
    Dept. of Microelectron., Delft Univ. of Technol., Delft, Netherlands
  • Volume
    33
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    318
  • Lastpage
    322
  • Abstract
    The impact of crosstalk effects on timing performance is increasing as the device geometries are shrinking. As a consequence, crosstalk effects need to be considered in statistical timing analysis for higher accuracy. In this letter, the statistical interconnect delay due to crosstalk effects is calculated based on a piecewise linear delay change curve model (PLDM), which enables fast closed-form analytical delay evaluation. The PLDM-based method is independent of the delay change characteristics and is able to handle both Gaussian and non-Gaussian input skew distributions. The proposed method can be integrated into a statistical timing analyzer with runtime proportional to the number of samples for PLDM characterization. Experimental results demonstrate that the proposed method can estimate the delay mean and standard deviation for coupled RC interconnects at PTM 65-nm technology with errors better than -0.07% and -1.23%, respectively, with only 20 samples for PLDM characterization. In addition, the proposed method typically achieves two to three orders of magnitude speedup compared to Monte Carlo simulations.
  • Keywords
    crosstalk; delay circuits; integrated circuit interconnections; piecewise linear techniques; statistical analysis; PLDM; PTM technology; closed-form analytical delay evaluation; coupled RC interconnects; crosstalk effects; delay change characteristics; nonGaussian input skew distributions; piecewise linear delay change curve; size 65 nm; standard deviation; statistical interconnect delay; statistical timing analysis; Accuracy; Crosstalk; Delays; Shape; Standards; Wires; Crosstalk effect; input skew; interconnect delay; process variation; statistical timing analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2279515
  • Filename
    6714522