DocumentCode :
637691
Title :
Analysis in commutation of a new high voltage thyristor structure for high temperature
Author :
Toulon, Gaetan ; Bourennane, A. ; Isoird, K.
Author_Institution :
LAAS, Toulouse, France
fYear :
2013
fDate :
20-22 June 2013
Firstpage :
426
Lastpage :
430
Abstract :
In this paper, a high voltage thyristor structure using Schottky contacts on the anode side is analysed through 2D physical simulations in terms of switching performances. The replacement of the P emitter of a standard symmetrical thyristor by a judicious association of P diffusions and Schottky contacts at the anode side contributes to the reduction of the leakage current in the forward direction and hence improves the forward blocking voltage at high temperature while maintaining its reverse blocking capability. It is shown by comparing this structure with a conventional thyristor, that the presence of Schottky contact does not degrade the turn-on process. It is also shown that the presence of Schottky contact increase the recovery speed of the device during turn-off, improving the maximum operating frequency of the device.
Keywords :
Schottky barriers; circuit simulation; diffusion; leakage currents; thyristors; 2D physical simulations; Schottky contacts; diffusions; high temperature; high voltage thyristor structure; leakage current; maximum operating frequency; recovery speed; switching performances; Anodes; Cathodes; Current density; Integrated circuit modeling; Leakage currents; Schottky barriers; Thyristors; High voltage thyristor; Pulsed power; Schottky contacts; TCAD simulations; high temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location :
Gdynia
Print_ISBN :
978-83-63578-00-8
Type :
conf
Filename :
6613389
Link To Document :
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