• DocumentCode
    638744
  • Title

    Activation of silicon implanted with phosphorus atoms by microwave heating

  • Author

    Yoshidomi, Shinya ; Akiyama, Chihiro ; Furukawa, Jun-ichiro ; Hsumi, Masahiko ; Ishii, Takuro ; Sameshima, Takeru ; Inouchi, Yutaka ; Naito, Masakazu

  • Author_Institution
    Fac. of Eng., Tokyo Univ. of Agric. & Technol., Koganei, Japan
  • fYear
    2013
  • fDate
    2-5 July 2013
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    We report a simple method with a commercial microwave oven for activation of 22 Ωcm p-type silicon implanted with phosphorus atoms a dose of 1.0×1015 cm-2 at 1000 W for 9 min. Microwave transmittance measurement revealed a sheet resistance of 209 Ω/sq and an activation ratio of 60 %. The microwave heating achieved recrystallization of the amorphized surface region caused by ion implantation. Typical pn diode and solar cell characteristics with the conversion efficiency of 9.3 % were obtained.
  • Keywords
    amorphisation; electrical resistivity; elemental semiconductors; ion implantation; microwave materials processing; microwave spectra; phosphorus; recrystallisation; semiconductor diodes; semiconductor doping; silicon; solar cells; Si:P; activation ratio; amorphized surface; commercial microwave oven; conversion efficiency; ion implantation; microwave heating; microwave transmittance measurement; phosphorus atom implanted p-type silicon; pn diode; power 1000 W; recrystallization; sheet resistance; solar cell characteristics; time 9 min; Electromagnetic heating; Microwave measurement; Microwave ovens; Microwave theory and techniques; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2013 Twentieth International Workshop on
  • Conference_Location
    Kyoto
  • Type

    conf

  • Filename
    6617810