DocumentCode :
638749
Title :
High performance poly-Si thin film transistor with one-dimensionally long Si grains using DLB continuous-wave laser lateral crystallization
Author :
Yamano, Masayuki ; Kuroki, Shin-Ichiro ; Sato, Takao ; Kotani, Koji
Author_Institution :
Res. Inst. for Nanodevice & Bio Syst., Hiroshima Univ. (RNBS), Higashi-Hiroshima, Japan
fYear :
2013
fDate :
2-5 July 2013
Firstpage :
199
Lastpage :
202
Abstract :
One-dimensionally very large silicon grains with a length of over 100 μm were formed by continuous-wave laser crystallization with double-line spot. The laterally crystallized Si thin films have a preferential orientation of (110) plane. Poly-Si TFTs with one-dimensionally long silicon grains were also fabricated with low-temperature (≤550°C), metal gate self-aligned process. And high electron field effect mobility of 450 cm2/Vs was achieved.
Keywords :
crystallisation; electron mobility; elemental semiconductors; laser materials processing; semiconductor thin films; silicon; thin film transistors; (110) orientation; DLB continuous-wave laser lateral crystallization; Si; continuous-wave laser crystallization; double-line spot; electron field effect mobility; high performance poly-Si thin film transistor; laterally crystallized thin films; one-dimensionally long grains; Crystallization; Laser beams; Lasers; Logic gates; Measurement by laser beam; Silicon; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2013 Twentieth International Workshop on
Conference_Location :
Kyoto
Type :
conf
Filename :
6617815
Link To Document :
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