Title :
Dynamic fault diagnosis in chemical process based on SVM-HMM
Author :
Yi Peng ; Xiaodan Zhang ; Zhenjun Han ; Jianbin Jiao
Author_Institution :
Sch. of Electron., Electr. & Commun. Eng., Grad. Univ. of Chinese Acad. of Sci., Beijing, China
Abstract :
Based on Hidden Markov Support Vector Machines (SVM-HMM) we present a novel dynamic fault diagnosis approach, in which the dynamic of chemical process is considered through augmenting each observation vector by using mean value and variance of the previous observations. Herein, SVM-HMM is a good method for dynamic continuous data which indentifies multiple kinds of faults with only one uniform discriminative model instead of multiple ones. A benchmark of Tennessee Eastman Process (TEP), a chemical engineering problem, is carried out to generate datasets to examine the performance of our new method. And the experiment results show the faults are identified more accurately applying the proposed method than that done by the state-of-the-art approaches.
Keywords :
chemical engineering computing; chemical industry; fault diagnosis; hidden Markov models; production engineering computing; support vector machines; SVM-HMM; Tennessee Eastman process; chemical engineering problem; chemical process; discriminative model; dynamic fault diagnosis approach; hidden Markov models; mean value; observation vector; support vector machines; variance; Chemical processes; Fault detection; Fault diagnosis; Hidden Markov models; Monitoring; Support vector machines; Training; Chemical Process; Dynamic Fault diagnosis; SVM-HMM; Tennessee Eastman Process;
Conference_Titel :
Mechatronics and Automation (ICMA), 2013 IEEE International Conference on
Conference_Location :
Takamatsu
Print_ISBN :
978-1-4673-5557-5
DOI :
10.1109/ICMA.2013.6618169