DocumentCode
641350
Title
Analytical study of complementary memristive synchronous logic gates
Author
Portal, J.M. ; Moreau, M. ; Bocquet, Michael ; Aziza, H. ; Deleruyelle, D. ; Muller, Candice ; Zhang, Ye ; Deng, Erya ; Klein, J.O. ; Querlioz, Damien ; Ravelosona, Dafine ; Chappert, Claude ; Zhao, Weisheng S.
Author_Institution
IM2NP, Aix-Marseille Univ., Marseille, France
fYear
2013
fDate
15-17 July 2013
Firstpage
70
Lastpage
75
Abstract
This paper describes an analytical study of synchronous logic gate design based on hybrid structure with MOS and resistive switching non-volatile memories (RS-NVMs). This type of structure allows ultra-low power consumption during power down, while often-used data are saved in RS-NVM cells. The parallel data sensing achieves low-power and fast computation time. The logic gate construction theory, from Boolean equation to hybrid MOS/RS-NVM tree, is deeply detailed. Read and write design guideline, regarding RS-NVM and MOS resistance balance are investigated. Practical implementation is given through transient simulations based on two memory technologies: STT-MRAM and OxRRAM to validate the concept by using CMOS 40 nm design kit and memory compact models.
Keywords
Boolean functions; CMOS logic circuits; MRAM devices; logic gates; low-power electronics; memristors; trees (mathematics); Boolean equation; CMOS 40 nm design kit; MOS; OxRRAM; STT-MRAM; complementary memristive synchronous logic gates; hybrid MOS-RS-NVM tree; logic gate construction theory; memory compact models; oxide resistive RAM; parallel data sensing; read-write design guideline; resistive switching nonvolatile memories; size 40 nm; spin transfer torque magnetic random access memory; synchronous logic gate design; ultralow power consumption; Computer architecture; Logic gates; Mathematical model; Resistance; Semiconductor device modeling; Switches; Transient analysis; Low-Power design; Resistive Switching; complementary cell; synchronous logic gate;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on
Conference_Location
Brooklyn, NY
Print_ISBN
978-1-4799-0873-8
Type
conf
DOI
10.1109/NanoArch.2013.6623047
Filename
6623047
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