DocumentCode
642418
Title
Table of contents and programme
fYear
2013
fDate
3-5 Sept. 2013
Abstract
The following topics are dealt with: reliability; process simulation; compact models; interconnects; nanowires; FinFET; Monte Carlo transport; TCAD; random-access memories; and quantum transport.
Keywords
MOSFET; Monte Carlo methods; integrated circuit interconnections; nanowires; random-access storage; semiconductor device models; semiconductor process modelling; technology CAD (electronics); FinFET; Monte Carlo transport; TCAD; compact models; interconnects; nanowires; process simulation; quantum transport; random-access memories; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
Conference_Location
Glasgow
ISSN
1946-1569
Print_ISBN
978-1-4673-5733-3
Type
conf
DOI
10.1109/SISPAD.2013.6650558
Filename
6650558
Link To Document