Title :
An efficient eye-diagram determination technique for multi-coupled interconnect lines
Author :
Junghyun Lee ; Yungseon Eo
Author_Institution :
Dept. Electron. & Commun. Eng., Hanyang Univ., Ansan, South Korea
Abstract :
A new, accurate, and efficient eye-diagram determination technique for multi-coupled interconnect lines is proposed. All the switching-dependent step responses are analytically determined, followed by eye-height, jitter, and worst-case eye-diagram for inter-symbol-interference (ISI). In addition, the proposed technique generates the worst-case input patterns of the worst-case eye-diagram. The accuracy and efficiency of the proposed technique is verified with a test circuit using 3-coupled lines.
Keywords :
integrated circuit interconnections; intersymbol interference; jitter; 3-coupled lines; ISI; eye-diagram determination; intersymbol-interference; jitter; multicoupled interconnect lines; switching-dependent step response; test circuit; worst-case eye-diagram; worst-case input patterns; Accuracy; Algorithm design and analysis; Integrated circuit interconnections; Jitter; Switches; Time-domain analysis; Vectors;
Conference_Titel :
Power and Timing Modeling, Optimization and Simulation (PATMOS), 2013 23rd International Workshop on
Conference_Location :
Karlsruhe
DOI :
10.1109/PATMOS.2013.6662172