Non-destructive microwave characterization and imaging of dielectric materials using a near field technique

Author

Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme

Author_Institution

XLIM, Univ. of Limoges, Limoges, France

fYear

2013

fDate

2-5 Sept. 2013

Firstpage

1

Lastpage

4

Abstract

We describe a contactless technique for dielectric permittivity characterization using a resonant near-field scanning microwave microscope. By measuring the shift in the system´s resonant frequency as we scan over an insulating sample, we obtain quantitative images of dielectric variations. This system is composed of a probe coupled to a dielectric resonator.

Keywords

dielectric materials; dielectric resonators; insulating materials; microscopes; microwave devices; microwave imaging; permittivity measurement; contactless technique; dielectric material; dielectric permittivity characterization; dielectric resonator; insulating sample; nondestructive microwave characterization; nondestructive microwave imaging; quantitative imaging; resonant frequency measurement; resonant near-field scanning microwave microscope; Dielectric constant; Dielectric measurement; Microscopy; Permittivity; Probes; Resonant frequency; dielectric cartography; dielectric constant; dielectric material; dielectric resonator; near field microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium (MMS), 2013 13th Mediterranean

Conference_Location

Saida

Type

conf

DOI

10.1109/MMS.2013.6663074

Filename

6663074