• DocumentCode
    643367
  • Title

    Implementation of a Modified Model-SRAM Using Tanner EDA

  • Author

    Singh, Chaman ; Grover, Anuj ; Grover, Neeti

  • Author_Institution
    SBSSTC Ferozepur, Ferozepur, India
  • fYear
    2013
  • fDate
    24-25 Sept. 2013
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    Due to the increased demand of SRAM with large use of SRAM in System On-Chip, the oxide thickness has become a tough challenge in CMOS technology. The leakage power also affects the chip design process. Speed of SRAM and Power consumption are also taken care of for designing a chip. This article represents the simulation of 6T SRAM; Asymmetric SRAM cells using low power reduction techniques. All the simulations have been carried out on 180nm at Tanner EDA tool. In this article, SRAM cell will includes one more extra transistor that will control the overall capacitances during the write and read operation and will optimize the total capacitance that results in decrease in the power dissipation. The circuit verification is done on the Tanner tool, Schematic of the SRAM cell is designed on the S Edit and net list simulation done by using T-spice and waveforms are analyzed through the W-edit.
  • Keywords
    CMOS memory circuits; circuit CAD; low-power electronics; system-on-chip; 6T SRAM simulation; CMOS technology; S-edit; T-Spice; Tanner EDA tool; W-edit; asymmetric SRAM cells; capacitance control; chip design process; circuit verification; leakage power; modified model-SRAM; net list simulation; power consumption; power dissipation; power reduction techniques; size 180 nm; system on-chip; transistor; waveform analysis; write-read operation; CMOS integrated circuits; Computer architecture; Power demand; SRAM cells; Transistors; Very large scale integration; CMOS Logic; SRAM and VLSI.;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence, Modelling and Simulation (CIMSim), 2013 Fifth International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-2308-3
  • Type

    conf

  • DOI
    10.1109/CIMSim.2013.69
  • Filename
    6663215